NDLI: Measuring topography and refractive index of channel waveguides with a hybrid AFM-SNOM

Content Provider	IEEE Xplore Digital Library
Author	Mannoni, A. Quercioli, F. Tiribilli, B. Ascoli, C. Baschieri, P. Frediani, C.
Copyright Year	1983
Abstract	An hybrid atomic force-scanning near-field optical microscope (AFM-SNOM) has been realized starting from a home-built AFM. The instrument uses a tetrahedral SiN tip for force and near field detection and is designed to provide, besides simple imaging, a full three-dimensional (3-D) mapping of force, friction and light intensity on the sample. High-resolution optical images of dielectric samples are presented together with curves describing the behavior of the collected optical intensity as a function of tip-object distance. AFM images and force-distance curves are reported as well and are compared with those obtained from the optical channel. Subwavelength features of the samples can be easily appreciated in both kinds of images, and the refractive index of the object can be computed from the attenuation constant of the tunneling light detected by the tip, with the AFM curve providing a convenient way of detecting the contact point. The spatial resolution of this kind of measurement is far better than that obtainable with any other index-measuring device. Homogeneous glass samples as well as monomode channel waveguides were analyzed in our experiments. The refractive index of several different prisms, made either of BK7 (n=1.519 at /spl lambda/=532 nm) or of SF58 (n=1.932) glass, could be measured with our near-field technique. As for the channel waveguides, the accuracy of our measurements lets us detect their presence and lateral extension in the substrate but is not yet sufficient to allow the reconstruction of their index profile.
Sponsorship	IEEE Lasers and Electro-Optics Society Optical Society of America
Starting Page	388
Ending Page	394
Page Count	7
File Size	148149
File Format	PDF
ISSN	07338724
Volume Number	16
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Surfaces Refractive index Optical attenuators Optical waveguides Optical refraction Optical variables control Atom optics Atomic force microscopy Optical microscopy Object detection
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in