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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Berger, R. Lyons, W.G. Soares, A. |
| Copyright Year | 1966 |
| Abstract | A test chip has been fabricated in a fully depleted SOI CMOS process with 0.25-/spl mu/m drawn gate length, It successfully demonstrates the types of circuits required to perform digital filtering, detection, and data thinning functions at high clock speeds. The test chip contains over 5000 transistors and was clocked at speeds up to 1.3 GHz. A target application for these circuits is a very wideband compressive receiver for real-time spectral analysis, which requires digital signal processing to be performed on a 20-Gb/s data stream formed by digitizing a stream of fast analog pulses. Adjustable high-speed on-chip clocks, input and output registers, and large decoupling capacitors allowed testing of the chip to be performed using an inexpensive, low-speed probe card and a standard wafer prober. |
| Sponsorship | IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE |
| Starting Page | 1259 |
| Ending Page | 1261 |
| Page Count | 3 |
| File Size | 55595 |
| File Format | |
| ISSN | 00189200 |
| Volume Number | 33 |
| Issue Number | 8 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Circuit testing Clocks Performance evaluation CMOS process Digital filters Filtering Wideband Spectral analysis Digital signal processing chips Pulse circuits |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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