NDLI: Loading effects in resistance scaling

Content Provider	IEEE Xplore Digital Library
Author	Elmquist, R.E. Dziuba, R.F.
Copyright Year	1963
Abstract	Reference resistors are affected by the heating of the resistor element caused by the measurement current. The effects of such loading are complex and can change in magnitude as a function or the initial state of the resistor and the external environment. This paper describes a method for determining relative lead coefficients by using cryogenic current comparator ratio measurements in a two-step scaling process, previously undiscovercd loading effects are analyzed using a resistance element made from copper, which has an easily measured change of resistance with temperature. The magnitude of loading effects in several types of resistors are listed.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	322
Ending Page	324
Page Count	3
File Size	85114
File Format	PDF
ISSN	00189456
Volume Number	46
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Resistors Electrical resistance measurement Electric resistance Copper NIST Temperature Current measurement Power measurement Cryogenics Bridges
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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