NDLI: Optimum 3-step step-stress tests

Content Provider	IEEE Xplore Digital Library
Author	Khamis, I.H. Higgins, J.J.
Copyright Year	1963
Abstract	Optimum simple step-stress accelerated life testing plans have practical limitations. They highly depend upon the assumption of a linear relationship between stress and time-to-failure and use only two extreme stresses that can cause irrelevant failure modes. Thus, 3-step plans are preferable. In this paper, the authors derive the optimum quadratic plan and propose and evaluate a 3-step test plan, the compound linear, as an alternative to the optimum simple step-stress plan and optimum quadratic plan. The compound linear plan is better than two compromise plans proposed for constant stress testing and nearly as good as a proposed optimum compromise plan, the advantage being its simplicity. A small sample-size study shows that the efficiency of the test plan is not appreciably affected by the sample size, so that the asymptotic results are a good indication of the performance in sample sizes encountered in practice.
Sponsorship	IEEE Reliability Society
Starting Page	341
Ending Page	345
Page Count	5
File Size	405137
File Format	PDF
ISSN	00189529
Volume Number	45
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stress Life testing Life estimation Maximum likelihood estimation Mean square error methods Materials testing Acceleration Uncertainty Costs Weibull distribution
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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