NDLI: Detection of environmental ultraviolet radiation by the induced electroluminescence in a ceramic detector

Content Provider	IEEE Xplore Digital Library
Author	Ching-Shen Su Li-Chung Wei
Copyright Year	1963
Abstract	Environmental ultraviolet (UV) radiation can be detected passively by a ceramic sensor by measuring the radiation-induced electroluminescence (EL). The phenomenon that metal-oxide ceramic material doped with certain impurities can emit photons under high electric fields after irradiation by UV has been observed in our laboratory. This phenomenon of EL only exists after the sensor has been irradiated by UV radiation. After the emission of photons, the sensor material returns to the normal state, and no more photons win be emitted even though the electric field is applied again. The emitted light may have different wavelengths which depend on the base material of the sensor and the impurity. The peak height of the EL curve represents the number of radiation-induced photons which is directly in proportion to the exposure of the UV radiation; thus the radiation-induced EL can be used as the UV radiation detector. A device for measuring the radiation-induced EL was constructed using a high-vacuum chamber and a facility to supply a high electric held across the UV sensor. A photodetector with its output system is used to register the emitted light from the EL. The UV-induced EL in ZrO/sub 2/ with zinc oxide as impurity has been obtained. Other base materials such as Gd/sub 2/O/sub 3/ and MgO are being investigated for the same phenomena.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	585
Ending Page	587
Page Count	3
File Size	317564
File Format	PDF
ISSN	00189456
Volume Number	45
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radiation detectors Optoelectronic and photonic sensors Sensor phenomena and characterization Impurities Ceramics Electroluminescence Inorganic materials Laboratories Electric variables measurement Photodetectors
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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