NDLI: Transition density: a new measure of activity in digital circuits

Content Provider	IEEE Xplore Digital Library
Author	Najm, F.N.
Copyright Year	1982
Abstract	Noting that a common element in most causes of runtime failure is the extent of circuit activity, i.e. the rate at which its nodes are switching, the author proposes a measure of activity, called the transition density, which may be defined as the average switching rate at a circuit node. An algorithm is also presented to propagate density values from the primary inputs to internal and output nodes. To illustrate the practical significance of this work, it is shown how the density values at internal nodes can be used to study circuit reliability by estimating the average power and ground currents; the average power dissipation; the susceptibility to electromigration failures; and the extent of hot-electron degradation. The density propagation algorithm has been implemented in a prototype density simulator which is used to assess the validity and feasibility of the approach experimentally. The results show that the approach is very efficient, and makes possible the analysis of VLSI circuits.<>
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	310
Ending Page	323
Page Count	14
File Size	1292928
File Format	PDF
ISSN	02780070
Volume Number	12
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1993-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Density measurement Digital circuits Switching circuits Runtime Power dissipation Electromigration Degradation Virtual prototyping Circuit simulation Circuit analysis
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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