NDLI: Design of a fault-tolerant three-dimensional dynamic random-access memory with on-chip error-correcting circuit

Content Provider	IEEE Xplore Digital Library
Author	Mazumder, P.
Copyright Year	1968
Abstract	Most current-generation multimegabit dynamic random-access memory (DRAM) chips use three-dimensional storage capacitors where the charge is stored on a vertically integrated trench-type structure and are highly vulnerable to alpha particles, which frequently create plasma shorts between two adjoining trench capacitors on the same word line, resulting in uncorrectable double-bit soft errors. The author presents a systematic study of soft-error related problems and discusses methodologies for correcting single-bit and double-bit memory-cell upsets by using on-chip error-correcting-code (ECC) circuits. By modifying the product code, an effective coding scheme has been designed that can be integrated within a DRAM chip to correct double-bit errors. It is demonstrated that the reliability of a memory chip can be improved by several million times by integrating the proposed circuit. The area and timing overhead are calculated and compared with those of memory chips without any ECC and chips with single-error-correcting (SEC) codes. The ability of the circuit to correct soft errors in the presence of multiple-bit errors is analyzed.<>
Sponsorship	IEEE Computer Society Technical Committee on Distributed Process IEEE Computer Society Technical Committee on VLSI IEEE Technical Committee on Computer Architecture IEEE Computer Society
Starting Page	1453
Ending Page	1468
Page Count	16
File Size	1452503
File Format	PDF
ISSN	00189340
Volume Number	42
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1993-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault tolerance Error correction Error correction codes Capacitors Alpha particles Plasmas System-on-a-chip Product codes Integrated circuit reliability Timing
Content Type	Text
Resource Type	Article
Subject	Theoretical Computer Science Computational Theory and Mathematics Software Hardware and Architecture

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