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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Amendolia, S.R. Galeotti, S. Morsani, F. Passuello, D. Ristori, L. Sciacca, G. Turini, N. |
| Copyright Year | 1963 |
| Abstract | An associative memory full-custom CMOS VLSI chip (AMchip), to be used in fast trigger systems for pattern recognition, has been designed and is being tested. The AMchip is a full-custom associative memory IC developed for high energy physics. It contains about 140000 MOS transistors, has been realized in 1.5- mu m, double-metal, silicon gate CMOS technology, and is housed in a 120-pin package. The AMchip has been designed to be used with any kind of detector which provides in the output the hit coordinates. Some preliminary tests have been done on the 55 prototypes received from the ES2 (European silicon structures) foundry. The performance test, limited by the equipment used, has shown that the AMchip can work with a 20-MHz clock.< |
| Sponsorship | IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD |
| Starting Page | 795 |
| Ending Page | 797 |
| Page Count | 3 |
| File Size | 287691 |
| File Format | |
| ISSN | 00189499 |
| Volume Number | 39 |
| Issue Number | 4 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1992-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Very large scale integration Associative memory Silicon CMOS technology Pattern recognition System testing MOSFETs Packaging machines Detectors Prototypes |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering |
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