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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Fair, R.B. |
| Copyright Year | 1963 |
| Abstract | It is argued that the cost of manufacturing submicron, ultra-large-scale integration (ULSI) integrated circuits (ICs) (which is scaling upward at least in inverse proportion to the downward scaling of device feature sizes) is driven by a parameter budget crisis associated with the technological and complexity limits of IC design and fabrication. This budget crisis is defined for technologies associated with patterning, mechanical control, thermal treatments, particulates and contamination, defects, electrical parameters, and manufacturing, R&D priorities for silicon ULSI are identified and quantified, and the potential impact of some recent research results is discussed. It is pointed out that the R&D agenda to deal with the ULSI manufacturing budget crisis is enormous, and the semiconductor industry cannot perform all of it. Since the time for transferring new developments into production tools and technologies is five to seven years, it is concluded that critical funding decisions need to be made now for ULSI manufacturing science breakthroughs by the turn of the century.< |
| Sponsorship | IEEE Publication |
| Starting Page | 1687 |
| Ending Page | 1705 |
| Page Count | 19 |
| File Size | 2027378 |
| File Format | |
| ISSN | 00189219 |
| Volume Number | 78 |
| Issue Number | 11 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Manufacturing Ultra large scale integration Semiconductor device manufacture Integrated circuit technology Costs Integrated circuit manufacture Fabrication Contamination Silicon Electronics industry |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Science Electrical and Electronic Engineering |
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