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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Dervisoglu, B.I. |
| Copyright Year | 1982 |
| Abstract | An architecture for implementing scan technology for test and debug in a state-of-the-art workstation is described. Architectural features include controlling the scan and clock functions from a single resource that can also perform LFSR (linear feedback shift register) based pseudorandom testing and test result compression via signature capture. Operations of the scan subsystem are controlled from a service processor that uses a diagnostics bus to communicate with individual scan and clock resource units present on each system board. For debug purposes the service processor has been linked with a remote computer, and software has been developed to display and/or modify system state variables (flip-flops). Analysis of scan overhead indicates that benefits in test and debug of the target system far outweight the cost of implementing scan technology for the APOLLO DN10000 workstation.< |
| Sponsorship | IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society |
| Starting Page | 612 |
| Ending Page | 620 |
| Page Count | 9 |
| File Size | 951173 |
| File Format | |
| ISSN | 02780070 |
| Volume Number | 9 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Application software Hardware Software debugging Testing Workstations Clocks Computer displays Computer architecture Linear feedback control systems Performance evaluation |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software |
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