NDLI: Physical design of testable VLSI: techniques and experiments

Content Provider	IEEE Xplore Digital Library
Author	Levitt, M.E. Abraham, J.A.
Copyright Year	1966
Abstract	It is shown that the layout of VLSI circuits can affect testability and in some cases reduce the number of faults likely in a design, easing test generation. A method for analyzing circuits at the symbolic layout level and enhancing testability using local transformations is presented. To demonstrate the application of the technique a set of CMOS standard cells was redesigned. The standard cells are used in the MIS synthesis system, allowing the designer to modify interactively designs to perform tradeoff analysis on testable designs. To show the usefulness of the technique, an experiment was performed: example circuits were synthesized, and test vectors were generated and then used in a transistor-level fault simulator. It was found that the modified designs have significantly higher fault coverage than unmodified designs. A strategy for the synthesis of easily testable combinational random logic circuits is presented.<>
Sponsorship	IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE
Starting Page	474
Ending Page	481
Page Count	8
File Size	853479
File Format	PDF
ISSN	00189200
Volume Number	25
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Very large scale integration Circuit testing Circuit faults Circuit synthesis Performance evaluation Circuit analysis Performance analysis System testing Circuit simulation Logic testing
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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