NDLI: Effect of dead space on the excess noise factor and time response of avalanche photodiodes

Content Provider	IEEE Xplore Digital Library
Author	Saleh, B.E.A. Hayat, M.M. Teich, M.C.
Copyright Year	1963
Abstract	The effect of dead space on the statistics of the gain process in continuous-multiplication avalanche photodiodes (APDs) is determined using the theory of age-dependent branching processes. The dead space is the minimum distance that a newly generated carrier must travel in order to acquire sufficient energy to cause an impact ionization. Analytical expressions are derived for the mean gain, the excess noise factor, and the mean and standard deviation of the impulse response function, for the dead-space-modified avalanche photodiode (DAPD), under conditions of single carrier multiplication. The results differ considerably from the well-known formulas derived by R.J. McIntyre and S.D. Personick in the absence of dead space. Relatively simple asymptotic expressions for the mean gain and excess noise factor are obtained for devices with long multiplication regions. In terms of the signal-to-noise ratio (SNR) of an optical receiver in the presence of circuit noise, it is established that there is a salutory effect of using a properly designed DAPD in place of a conventional APD. The relative merits of using DAPD versus a multilayer (superlattice) avalanche photodiode (SAPD) are examined in the context of receiver SNR; the best choice turns out to depend on which device parameters are used for the comparison.<>
Sponsorship	IEEE Electron Devices Society
Starting Page	1976
Ending Page	1984
Page Count	9
File Size	848683
File Format	PDF
ISSN	00189383
Volume Number	37
Issue Number	9
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Time factors Space exploration Avalanche photodiodes Signal to noise ratio Circuit noise Optical receivers Statistics Impact ionization Optical noise Optical design
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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