NDLI: A probabilistic life model for insulating materials showing electrical thresholds

Content Provider	IEEE Xplore Digital Library
Author	Montanari, G.C. Cacciari, M.
Copyright Year	1965
Abstract	A probabilistic life model for insulating materials showing lifelines for combined thermal-electrical stresses which tend towards electrical thresholds is proposed. The model is obtained by starting from the two-parameter Weibull distribution of times to failure, and explaining scale and shape parameters so that time-to-failure percentiles agree with life curves showing an upward curvature and a tendency to infinite life. The parameters of the probabilistic life model are explained as a function of stresses, thus providing a complete characterization of the combined-stress endurance and, hence, estimation of electrical threshold at each selected temperature, including service stresses. The validity of the model is verified by means of experimental results from a test cycle carried out on XLPE (cross-linked polyethylene)-insulated cable models.<>
Sponsorship	IEEE Waseda Univ Univ. Salford
Starting Page	127
Ending Page	134
Page Count	8
File Size	580222
File Format	PDF
ISSN	00189367
Volume Number	24
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-02-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectrics and electrical insulation Thermal stresses Temperature distribution Life testing Aging Equations Inverse problems Weibull distribution Life estimation Power cables
Content Type	Text
Resource Type	Article
Subject	Engineering Electrical and Electronic Engineering

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