NDLI: Determination of lifetime and surface recombination velocity of p-n junction solar cells and diodes by observing transients

Content Provider	IEEE Xplore Digital Library
Author	Lindholm, F.A. Liou, J.J. Neugroschel, A. Jung, T.W.
Copyright Year	1963
Abstract	The unified view of transient methods for the determination of recombination lifetime τ and back surface recombination velocity S presented here for silicon solar cells and diodes attempts to define limitations of existing methods and to evolve improvements. The presence of sizable junction capacitance for silicon devices under forward voltage invalidates the use of conventional open-circuit voltage decay (OCVD) and reverse recovery. This led Green to his method of compensated open-circuit voltage decay, in which the addition of an external resistor shunting the solar cell partially corrects for the presence of the junction capacitance. Setting this resistance to zero produces an electrical short-circuit current-decay method, Which has the advantage of enabling determination of both τ and S. In an alternate approach, one may insert the functional dependence of the junction capacitance on forward voltage. This new method, denoted by the acronym OCVDCAP, enables the determination of τ with apparently greater accuracy than that obtained by previous methods utilizing voltage transients. But OCVDCAP has in common with the previous methods that it determines τ only and has practical Utility only for determining τ of long-base devices. This means that it is useful only for thick base regions. In principle, however, it has an advantage over short-circuit current decay: it requires only pressure contacts, not ohmic contacts, and therefore may be used to determine τ after key processing steps in manufacturing.
Sponsorship	IEEE Electron Devices Society
Starting Page	277
Ending Page	285
Page Count	9
File Size	1152433
File Format	PDF
ISSN	00189383
Volume Number	34
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1987-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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