NDLI: Photon Count and Contrast-Detail Detection Potential Comparison between Parallel and Fan Beam Brain SPECT

Content Provider	IEEE Xplore Digital Library
Author	Kim, K. I. Lim, C. B.
Copyright Year	1963
Abstract	Current brain SPECT based on parallel beam projection with round shape Anger cameras suffers from both low sensitivity and poor resolution due to shoulder interference. SPECT using fan beam projection with a wide rectangular camera would significantly improve image quality by increased sensitivity and close brain access. For experimental verification a rectangular camera of 16" × 8.7" FOV has been developed with a shoulder edge of 3". For this geometry sensitivity and resolution improvement have been measured. Fan beam imaging tests verified the analysis results by showing 60% sensitivity increase and resolution improvement to 10 mm from 13-14 mm at image center. In order to assess the imaging improvement level quantitatively, analytical comparison on SPECT contrast-detail detectability has been made. Experimental contrast-detail detectability comparison between parallel and fan beam brain SPECT is presented together with the predicted model result.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	579
Ending Page	582
Page Count	4
File Size	2307845
File Format	PDF
ISSN	00189499
Volume Number	33
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1986-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Single photon emission computed tomography Cameras Image analysis Shape Interference Image quality Geometry Testing Image resolution Brain modeling
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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