NDLI: Built-In Self-Test Trends in Motorola Microprocessors

Content Provider	IEEE Xplore Digital Library
Author	Daniels, R.G. Bruce, W.C.
Copyright Year	1984
Abstract	The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature.¿ Though the BIST approach¿an idea conceived as a way to reduce production costs for the MC6805 family¿did not meet its major design objective, the experience provided impetus for the development of BIST techniques for the MC6804P2, which met most of the objectives intended for the MC6805P2. The Motorola microprocessor family has come to incorporate a growing number of testability features; current devices typically employ a combination of BIST and other techniques. If present trends continue, transistor counts for microprocessor-related parts should approach 10 million within 10 years. The authors argue that structured design techniques offer the most promising prospects for solving the design and test problems resulting from this increase in complexity.
Sponsorship	IEEE Computer Society
Starting Page	64
Ending Page	71
Page Count	8
File Size	6044672
File Format	PDF
ISSN	07407475
Volume Number	2
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE) Computer Society
Publisher Date	1985-04-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Microprocessors Very large scale integration Process design Production Processor scheduling Design for testability Design methodology Automatic testing MOS devices
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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