NDLI: Automatic Design for Testability Via Testability Measures

Content Provider	IEEE Xplore Digital Library
Author	Ting-Hua Chen Breuer, M.A.
Copyright Year	1982
Abstract	In this paper we present a technique for the automatic design for testability of digital circuits based upon the analysis of controllability and observability measures. The new concept of sensitivity is introduced, which is a measure for the degree to which the testability of a circuit improves as increased controllability and observability is achieved over a set of nodes in a circuit. In order to improve the testability of a circuit, three simple transformations are used, namely, the addition of a new primary input and possibly an AND (OR) gate so that a logic 0(1) can be injected into the interior of the circuit, and test points so that internal signal values can be observed. We then introduce the global r-modification problem, which deals with making r (integer) transformations to a circuit in order to improve its testability. This resynthesis problem has been formulated as a mixed integer linear programming problem. A program called Testability Improvement Program (TIP) has been developed for implementing this approach, and experimental results are presented. The work presented is applicable to problems of test generation, the design of fixtures for ATE, and determining the location of test pads on integrated circuit chips when employing electron beam testing.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	3
Ending Page	11
Page Count	9
File Size	1276521
File Format	PDF
ISSN	02780070
Volume Number	4
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1985-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Design for testability Automatic testing Circuit testing Logic testing Integrated circuit testing Controllability Observability Digital circuits Logic circuits Mixed integer linear programming
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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