NDLI: Application of Nonlineanty Measurng Method Using Two Frequencies to Electrcal Components

Content Provider	IEEE Xplore Digital Library
Author	Kanno, Makoto Minowa, Isao
Copyright Year	1963
Description	Information of nonlinearity in voltage and current characteristics of electrical components has been used for finding their defect. A commonly used method is that the third-harmonic frequency produced by the nonlinearity is picked up as a measure of the nonlinearity, when a current of single frequency is given to the component. A method using two frequencies is introduced in this paper. In this method, two currents of different frequencies are fed into a component under test, and one of newly produced frequencies by intermodulation caused by the nonlinearity is selected as the measure of the nonlinearity of the component. Features of this method are: 1) distortion in the current sources is allowed; 2) detecting frequency can be made very much lower than that of the sources; 3) filters to select the detecting frequency from the source frequencies can be made simpler; and 4) measurement of multi-orders of distortion became possible, while keeping the same connection, by changing the source frequency. The measuring method and some characterized measured results are shown. The results obtained by this not only show existence and amount of very small nonlinearity, but also show characters of the nonlinearity of the component with large exaggeration. It is expected then that the results may be used for analysis of physical phenomena of electrical conduction in the component, as well as for finding its defect.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	590
Ending Page	593
Page Count	4
File Size	529125
File Format	PDF
ISSN	00189456
Volume Number	IM-34
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1985-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Frequency measurement Distortion measurement Transmission line measurements Current measurement Testing Frequency synthesizers Voltage Filters Resistors Capacitors
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Resistors With Calculable Frequency Dependencies Up to 1 MHz

RF impedance measurements by voltage-current detection

Permittivity Measurements at Microwave Frequencies Using Lumped Elements

Measurement of Resistance and Impedances at High Frequencies

Calculable coaxial resistors for precision measurements

RF-DC differences of micropotentiometers

A Direct-Reading AC Comparator Bridge for Resistance Measurement at Power Frequencies

Accurate RF voltage measurements using a sampling voltage tracker

An analytic method for measuring accurate fundamental frequency components

Application of Nonlineanty Measurng Method Using Two Frequencies to Electrcal Components

Similar Documents

Resistors With Calculable Frequency Dependencies Up to 1 MHz

RF impedance measurements by voltage-current detection

Permittivity Measurements at Microwave Frequencies Using Lumped Elements

Measurement of Resistance and Impedances at High Frequencies

Calculable coaxial resistors for precision measurements

RF-DC differences of micropotentiometers

A Direct-Reading AC Comparator Bridge for Resistance Measurement at Power Frequencies

Accurate RF voltage measurements using a sampling voltage tracker

An analytic method for measuring accurate fundamental frequency components

Application of Nonlineanty Measurng Method Using Two Frequencies to Electrcal Components