NDLI: Optimization Of Metallic Shields For Extruded Dielectric Cables Under Fault Conditions

Content Provider	IEEE Xplore Digital Library
Author	Lukac, R.G. Silver, D.A. Hartlein, R.A. Black, W.Z.
Copyright Year	1963
Abstract	Full scale laboratory tests were conducted to determine the maximum temperatures which round wire and flat strap metallic shields can withstand without damage under fault conditions. A computer model was developed to calculate the shield temperature rise with high accuracy for given cable designs, short-circuit currents and sequences. A simplified short-circuit test procedure was developed to facilitate evaluation of new cable designs. This procedure utilizes the computer program and a newly introduced concept of short-circuit equivalence factor which provides a tool for equating laboratory and field conditions. The results of this project, sponsored by EPRI, enable the cable engineer to optimize metallic shield designs with a substantial reduction of initial and operating costs.
Starting Page	3409
Ending Page	3418
Page Count	10
File Size	4928778
File Format	PDF
ISSN	00189510
Volume Number	PAS-103
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1984-12-01
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature Circuit faults Testing Power cables Fault currents Conductors Dielectrics and electrical insulation Laboratories Wire Design optimization
Content Type	Text
Resource Type	Article
Subject	Engineering Energy Engineering and Power Technology Electrical and Electronic Engineering

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