NDLI: Contact Erosion: Testing Machine and Switching Devices

Content Provider	IEEE Xplore Digital Library
Author	Muniesa, J.
Copyright Year	1978
Abstract	Silver and silver-cadmium oxide contact materials were tested on accelerated testing equipment with current only at break or at make; the bounce characteristics were kept constant during each experiment. At each operation arcing energy (at bounce or during opening) was recorded so that correlations between average arcing energy and wear could be made. Bounce at make was shown to be a critical parameter for the erosion of contact materials; for a given energy the wear rate can be ten or more times higher at make than at break. These wear rates were compared to the ones obtained with switching devices on an AC3 circuit. This was done by analyzing bounce characteristics and arcing energy at make and at break under the test current on each of the three poles of the switching devices during the test. The correlation between the erosion on the testing machine and on the contactors themselves was quite satisfactory when erosion was related to arcing energy. Further, the large spread generally observed on contactor life tests was shown to be of electrical and mechanical origin, and the contact materials were rarely involved if they had been properly manufactured.
Sponsorship	IEEE Electronic Industries Alliance American Society of Mechanical Engineering (ASME) NBS SAE
Starting Page	129
Ending Page	133
Page Count	5
File Size	664935
File Format	PDF
ISSN	01486411
Volume Number	6
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1983-03-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Life estimation Materials testing Contacts Circuit testing Life testing Contactors Manufacturing Laboratories Seminars Silver
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Engineering Electrical and Electronic Engineering

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