NDLI: An Efficient Algorithm for Optimal Design of Diagnostics

Content Provider	IEEE Xplore Digital Library
Author	Aly, Adel A. Elsayedaly, Nael A.
Copyright Year	1963
Abstract	Even though much work has been done in developing models to design diagnostic tests for fault isolation in electronic systems, there is still a lack of efficient, fast procedures. A new approach to the cost-effective design of fault isolation procedures is investigated. It is oriented specifically toward built-in-test (BIT) diagnostic subsystems for modular electronic equipment. The problem is formulated as a search tree. A branch and bound technique is used to find the optimal sequence of tests for the automatic BIT diagnostic to isolate a single malfunctioned unit among a group of Line Replaceable Units (LRUs). Dominance and branching rules are developed, and the algorithm is presented. An example problem is solved to illustrate the efficiency of the branch and bound algorithm. Computational results are given and discussed. The following conclusions can be drawn. 1. The branch and bound approach can be used successfully in designing a cost-effective fault-isolation procedure. Because of the branching and dominance rules, many of the non-optimal solutions are eliminated early in the solution procedure which could efficiently reduce the size of the required search tree, as well as the time and storage needed to find the optimal solution. 2. The proposed branch and bound algorithm is efficient in solving problems of size up to eight LRUs. 3. Even though the size of problems solved efficiently by the algorithm is limited to eight LRUs, this size is still greater than the size of any problem reported to be solved optimally in any previous work.
Sponsorship	IEEE Reliability Society
Starting Page	426
Ending Page	436
Page Count	11
File Size	1357547
File Format	PDF
ISSN	00189529
Volume Number	R-32
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1983-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Algorithm design and analysis Automatic testing Electronic equipment testing Cost function Dynamic programming Reliability theory Tree data structures System testing Electronic equipment Built-in-Test Fault isolation Branch and bound
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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