NDLI: Impossibility of Linear Two-Port Noise-Parameter Measurement with a Single Temperature Noise Source

Content Provider	IEEE Xplore Digital Library
Author	Gupta, Madhu Sudan
Copyright Year	1963
Description	The noise parameters of a linear two-port are usually evaluated through four measurements of the noise figure of the two-port, and the noise figure is in turn determined through the measurements of the noise power output of the two-port when a noise source is connected at its input. It is shown that if the noise power output is the only measured quantity, then the noise parameters cannot be calculated from measurements carried out with a single value of the source noise temperature. The minimum requirements for the determination of noise parameters are established.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	443
Ending Page	445
Page Count	3
File Size	913216
File Format	PDF
ISSN	00189456
Volume Number	32
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1983-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise measurement Temperature Noise figure Power measurement Noise reduction Admittance measurement Additive noise Character generation Frequency domain analysis Measurement errors
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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