NDLI: Correlation of low-frequency intensity and frequency fluctuations in GaAlAs lasers

Content Provider	IEEE Xplore Digital Library
Author	Dandridge, A. Taylor, H.
Copyright Year	1965
Abstract	The intensity and frequency noise in single-mode GaAlAs lasers have been measured and the correlation between these instabilities investigated. The measurements were made over the range from 10 Hz to 25 kHz in CSP, TJS, and BH laser structures. It is found that the coherence function for frequency noise and intensity noise from one facet is near unity at the lasing threshold, decreases rapidly with decreasing current below threshold, and also decreases, but more slowly, as the current is increased above threshold. Qualitatively similar behavior is found for the correlation between intensity noise from the two laser facets. Junction voltage fluctuations are not correlated with the other types of noise, except when longitudinal mode hopping is occurring. A model in which both intensity and frequency noise are related to local current variations and optical backscattering in the diode active region is developed to explain the results.
Sponsorship	IEEE Lasers and Electro-Optics Society
Starting Page	1738
Ending Page	1750
Page Count	13
File Size	1250136
File Format	PDF
ISSN	00189197
Volume Number	18
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1982-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Laser noise Optical noise Low-frequency noise Frequency measurement Noise measurement Laser modes Voltage fluctuations Active noise reduction Backscatter Diodes
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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