NDLI: Contact Resistance on Surfaces with Nonuniform Contaminant Films

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Year : 1980 Volume : 3

Year : 1979 Volume : 2

Year : 1978 Volume : 1

Contact Resistance on Surfaces with Nonuniform Contaminant Films

Content Provider	IEEE Xplore Digital Library
Author	Crane, G.
Copyright Year	1978
Abstract	A probe has been designed for making point-by-point mapping measurements of contact resistance over large surface areas. The probe, which operates in the low force range of 5 mg to 5 g, permits simultaneous measurement of both contact resistance as a function of load and the integral of contact resistance versus force. To accomplish this a magnetically damped torsion bar mounted pendulum/sample holder is electromagnetically driven against a smooth spherical probe tip mounted directly on a force transducer which, in turn, is mounted on an x-y precision translation stage. The associated instrument package includes a variable sweep rate electromagnetic drive, high-frequency rejecting load and contact voltage amplifiers (the latter being an ultrastable differential amplifier), a voltage-to-frequency converter, a scaler, and an x-y recorder. The probe has been used to explore spatial variations in contact resistance due to a nonuniform fiuoropolymer film on a gold substrate. The data show a large statistical variability, which is simply analyzed by assuming normally distributed surface asperities and applying this assumption to the accepted model for multi-asperity electrical contact. This procedure leads to a prediction that the square of the conductance will follow a Gaussian distribution. Contact resistances that were obtained in the course of this work as a function of force are shown to be consistent with the multi-asperity model, Data are presented which agree well with the statistical model. This insight into the statistical variability of contact resistance data is useful in that it suggests a successful data smoothing technique that presents a reasonable appearing line map of the effective contact resistance due to a nonuniform film. It is demonstrated that data smoothed in this fashion can be favorably compared to the degree of surface contamination as determined with a scanning electron microscope.
Sponsorship	IEEE Electronic Industries Alliance American Society of Mechanical Engineering (ASME) NBS SAE
Starting Page	5
Ending Page	9
Page Count	5
File Size	657931
File Format	PDF
ISSN	01486411
Volume Number	4
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1981-03-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Contact resistance Surface contamination Surface resistance Probes Force measurement Electrical resistance measurement Pollution measurement Voltage Differential amplifiers Area measurement
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Engineering Electrical and Electronic Engineering

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