NDLI: Multiple Fault Detection in Programmable Logic Arrays

Content Provider	IEEE Xplore Digital Library
Author	Agarwal, V.K.
Copyright Year	1968
Abstract	The increasing recognition of PLA's as efficient and viable modules for such purposes as microprogramming and design of sequential controllers has led to a growing interest in the development of optimum fault detection test sets for these modules. It is now well known that a fault type which is unique to PLA's is the class of contact faults. A single contact fault is the spurious presence or absence of a contact between a row and a column of a PLA. We consider in this paper the problem of determining the capability of complete single contact fault test sets to cover multiple contact faults of PLA's. Our approach consists of developing a model of PLA's which allows one to represent a contact fault in a PLA as a stuck-at fault in the model of the PLA. Using this model, it is shown that more than 98 percent of all multiple contact faults of size 8 and less are inherently covered by every complete single contact fault test set in a PLA. Applications of this model to stuck-at fault diagnosis are also discussed.
Sponsorship	IEEE Computer Society Technical Committee on Distributed Process IEEE Computer Society Technical Committee on VLSI IEEE Technical Committee on Computer Architecture IEEE Computer Society
Starting Page	518
Ending Page	522
Page Count	5
File Size	1181304
File Format	PDF
ISSN	00189340
Volume Number	C-29
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1980-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	single fault coverage Contact faults masking multiple fault detection PLA fault detection PLA modeling programmable logic arrays
Content Type	Text
Resource Type	Article
Subject	Theoretical Computer Science Computational Theory and Mathematics Software Hardware and Architecture

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