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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Weissman, D. Johnson, J. |
| Copyright Year | 1963 |
| Abstract | A microwave backscatter technique is presented that has the ability to sense the dominant surface wavelength of a random rough surface. The purpose of this technique is to perform this measurement from an aircraft or spacecraft, wherein the horizontal velocity of the radar is an important parameter of the measurement system. Attention will be directed at water surface conditions for which a dominant wavelength can be defined, then the spatial variations of reflectivity will have a two dimensional spectrum that is sufficiently close to that of waves to be useful. The measurement concept is based on the relative motion between the water waves and a nadir looking radar, and the fact that while the instantaneous Doppler frequency at the receiver returned by any elementary group of scatterers on a water wave is monotonically changing, the difference in the Doppler frequency between any two scattering "patches" stays approximately constant as these waves travel parallel to the major axis of an elliptical antenna footprint. The results of a theoretical analysis and a laboratory experiment with a continuous wave (CW) radar that encompasses several of the largest waves in the illuminated area show how the structure in the Doppler spectrum of the backscattered signal is related to the surface spectrum and its parameters in an especially direct and simple way when an incoherent envelope detector is the receiver. |
| Sponsorship | IEEE Antennas and Propagation Society |
| Starting Page | 730 |
| Ending Page | 737 |
| Page Count | 8 |
| File Size | 813948 |
| File Format | |
| ISSN | 0018926X |
| Volume Number | 27 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1979-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface waves Rough surfaces Surface roughness Wavelength measurement Backscatter Doppler radar Radar scattering Velocity measurement Radar measurements Frequency |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering |
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