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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Tasch, A.F. Frye, R.C. |
| Copyright Year | 1966 |
| Description | A new concept in MOS dynamic RAM cells is described and demonstrated. The charge-coupled RAM (CC RAM) cell combines the storage capacity and transfer gate of the one-transistor cell into a single gate. The resulting cell is simpler than the conventional one-transistor cell and possesses significant advantages in packing density and potentially higher yield. One of the variations of the CC RAM cell concept results in a cell whose operation is identical (voltage and timing) to that of the present one-transistor cell. In addition, the CC RAM cell fabrication is essentially the same as the present one-transistor cell process. The CC RAM is an attractive candidate for the next generation RAM's. |
| Sponsorship | IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE |
| Starting Page | 58 |
| Ending Page | 63 |
| Page Count | 6 |
| File Size | 1097739 |
| File Format | |
| ISSN | 00189200 |
| Volume Number | 11 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1976-02-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Read-write memory Charge coupled devices Random access memory Production Fabrication Ion beams Microwave devices Physics Aircraft DRAM chips |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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