NDLI: Sensitivity and Dynamic Range Considerations for Homodyne Detection Systems

Content Provider	IEEE Xplore Digital Library
Author	Jaggard, Dwight L. King, Ray J.
Copyright Year	1963
Description	The effects of modulation frequency, RF reference power, and external bias upon the sensitivity and dynamic range of microwave homodyne detection systems was measured for point contact diodes and low l/f noise Schottky and backward diodes. The measurements were made at 4.89 GHz using a signal to noise ratio of 3 dB and a detection system bandwidth of 10 Hz. Maximum sensitivities of -135, -150, and -145 dBm, and dynamic ranges of 92, 110, and 124 dB were measured for the point contact, Schottky, and backward diodes at modulation frequencies of 30, 30, and 3 kHz, respectively. It was found that the level of RF reference signal needed to obtain the maximum sensitivity was equal to or somewhat above the point where the diode changes from square law to linear detection. The results are significant in that previously reported homodyne sensitivities (not necessarily maximum) were on the order of -90 to -130 dBm for point contact diodes and no data are available for Schottky and backward diodes. Significantly improved stability, sensitivity, and dynamic range can be achieved using these low 1/f noise devices, the correct external bias, and the optimum RF reference power.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	331
Ending Page	338
Page Count	8
File Size	1640564
File Format	PDF
ISSN	00189456
Volume Number	22
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1973-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dynamic range Schottky diodes Radio frequency Frequency measurement Noise measurement Frequency modulation Power measurement Microwave measurements Signal to noise ratio Bandwidth
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

The Direct-Detection Noise-Measuring System and Its Threshold

High tangential signal sensitivity GaAs planar doped barrier diodes for microwave/millimeter-wave power detector applications

Quantitative Comparison of Solid-State Microwave Detectors

A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes

An Automatic Precision IF-Substitution Vector Ratio Meter for the Microwave Frequency Range

Noise in IMPATT Diode Amplifiers and Oscillators

A simple method for the evaluation of microwave mixer diodes

Microwave Instrumentation: An Historical Perspective

A W-band homodyne vector network analyzer with variable measurement port distance

Sensitivity and Dynamic Range Considerations for Homodyne Detection Systems

Similar Documents

The Direct-Detection Noise-Measuring System and Its Threshold

High tangential signal sensitivity GaAs planar doped barrier diodes for microwave/millimeter-wave power detector applications

Quantitative Comparison of Solid-State Microwave Detectors

A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes

An Automatic Precision IF-Substitution Vector Ratio Meter for the Microwave Frequency Range

Noise in IMPATT Diode Amplifiers and Oscillators

A simple method for the evaluation of microwave mixer diodes

Microwave Instrumentation: An Historical Perspective

A W-band homodyne vector network analyzer with variable measurement port distance

Sensitivity and Dynamic Range Considerations for Homodyne Detection Systems