NDLI: Improved Teager Energy Operator and Improved Chirp-Z Transform for Parameter Estimation of Voltage Flicker

Content Provider	IEEE Xplore Digital Library
Author	Feng Li Yunpeng Gao Yijia Cao Iravani, R.
Copyright Year	1986
Abstract	Effective estimation of voltage flicker components plays an important role in distribution systems for either flicker meters or flicker compensators. A novel approach has been presented in this paper to accurately estimate voltage flicker components by using the improved Teager energy operator (ITEO) and the improved chirp-Z transform (ICZT). The error correction factor K of the Teager energy operator is presented and ITEO is established to reduce the extraction errors of voltage flicker waveform. ICZT is used to extract the frequency and magnitude of the voltage envelope which is corrected by the K factor of ITEO. The effects of signal sampling rate, sampling number, spectrum subdivision points of ICZT, voltage harmonics and interharmonics, frequency fluctuation, and white noise are investigated. The implementation of the proposed approach in the digital-signal-processor platform is also introduced. Multiple simulation and experimental test application results validate the accuracy and efficiency of the proposed approach.
Sponsorship	IEEE Power Engineering Society
Starting Page	245
Ending Page	253
Page Count	9
File Size	1816184
File Format	PDF
ISSN	08858977
Volume Number	31
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2016-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Voltage fluctuations Frequency modulation Transforms Chirp Parameter estimation Estimation voltage flicker Correction factor envelope estimation improved chirp-Z transform (ICZT) improved Teager energy operator (ITEO)
Content Type	Text
Resource Type	Article
Subject	Energy Engineering and Power Technology Electrical and Electronic Engineering

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