NDLI: Investigating the Broadband Microwave Absorption of Nanodiamond Impurities

Content Provider	IEEE Xplore Digital Library
Author	Cuenca, J.A. Thomas, E. Mandal, S. Williams, O. Porch, A.
Copyright Year	1963
Abstract	Broadband microwave complex permittivity measurements of nanodiamond powders are presented. Previous studies show that measurements of dielectric loss strongly correlate with the presence of nondiamond surface impurities. In this study, the frequency dependence of these losses is investigated using the microwave cavity perturbation (MCP) and broadband coaxial probe (BCP) methods. This allowed further understanding as to what mechanisms contribute to the microwave absorption (free electron conduction or dielectric loss from the disordered surfaces). A multimode MCP system is used which utilizes TM0np modes to provide partial spectral characterization. The MCP results revealed minimal frequency dependence, unlike any static conduction-related mechanism. The BCP measurements corroborate the MCP results with much higher spectral resolution, and further demonstrate that disorder related loss may dominate over free electron conduction from 1-10 GHz. From 0.1-1 GHz, free electron conduction has a greater influence with a characteristic 1/f dependence implying that conduction may dominate at lower frequencies. However, the BCP method, while repeatable, lacks in precision compared to the cavity method. Nonetheless, the major conclusion in this paper is that through simple microwave permittivity measurements, nondiamond carbon impurities in nanodiamond powders are measurable most likely because of disorder related losses as opposed to free electron conduction.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	4110
Ending Page	4118
Page Count	9
File Size	1851008
File Format	PDF
ISSN	00189480
Volume Number	63
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microwave measurement Microwave theory and techniques Probes Impurities Permittivity measurement Dielectrics Permittivity permittivity measurement Cavity perturbation coaxial probe conduction disorder nanodiamond
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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