NDLI: Random-Space Dimensionality Reduction for Expedient Yield Estimation of Passive Microwave Structures

Content Provider	IEEE Xplore Digital Library
Author	Ochoa, J.S. Cangellaris, A.C.
Copyright Year	1963
Abstract	A methodology is presented for the expedient statistical analysis of the electromagnetic attributes of passive microwave structures exhibiting manufacturing uncertainty in geometric and material parameters. In the proposed approach, the computational complexity stemming from the high dimensionality of the random space that describes the uncertainty in the electromagnetic analysis of the structure is mitigated by employing a principal component analysis with sensitivity assessment in combination with an adaptive sparse grid collocation scheme. The method exploits the inherent dependencies between random parameters to reduce the number of simulations needed to extract the statistics of the desired output response. This leads to the expedient estimation of production yield by means of the cross-entropy algorithm, which provides for fast calculation of the failure probability for a given functionality criterion. The proposed methodology is demonstrated through its application to the analysis of crosstalk in coupled microstrip lines exhibiting manufacturing variability and the investigation of the variation the bandwidth characteristics of a bandpass filter in the presence of uncertainty in geometric and/or material parameters.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	4313
Ending Page	4321
Page Count	9
File Size	1334158
File Format	PDF
ISSN	00189480
Volume Number	61
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Interpolation Uncertainty Principal component analysis Adaptation models Electromagnetics Correlation yield estimation Interconnects manufacturing-induced uncertainty passive components stochastic electromagnetic modeling
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Random-space dimensionality reduction scheme for expedient analysis of microwave structures with manufacturing variability

Modeling device manufacturing uncertainty in Electromagnetic Simulations

Modeling of noisy electromagnetic fields using principal component analysis

Order reduction of finite element models of passive electromagnetic structures with statistical variability

Rapid Yield Estimation and Optimization of Microwave Structures Exploiting Feature-Based Statistical Analysis

Nonlinear statistical modeling and yield estimation technique for use in Monte Carlo simulations [microwave devices and ICs]

Adaptive windowed estimation of electromagnetic frequency spectra and radiation patterns to a specified uncertainty

Principal Component Analysis & Singular Value Decomposition in Matrix Dimensionality Reduction & Covariance / Correlation Estimation

Random-projection-based dimensionality reduction and decision fusion for hyperspectral target detection.

Random-Space Dimensionality Reduction for Expedient Yield Estimation of Passive Microwave Structures

Similar Documents

Random-space dimensionality reduction scheme for expedient analysis of microwave structures with manufacturing variability

Modeling device manufacturing uncertainty in Electromagnetic Simulations

Modeling of noisy electromagnetic fields using principal component analysis

Order reduction of finite element models of passive electromagnetic structures with statistical variability

Rapid Yield Estimation and Optimization of Microwave Structures Exploiting Feature-Based Statistical Analysis

Nonlinear statistical modeling and yield estimation technique for use in Monte Carlo simulations [microwave devices and ICs]

Adaptive windowed estimation of electromagnetic frequency spectra and radiation patterns to a specified uncertainty

Principal Component Analysis & Singular Value Decomposition in Matrix Dimensionality Reduction & Covariance / Correlation Estimation

Random-projection-based dimensionality reduction and decision fusion for hyperspectral target detection.

Random-Space Dimensionality Reduction for Expedient Yield Estimation of Passive Microwave Structures