NDLI: Estimating Weibull Parameters for a General Class of Devices from Limited Failure Data

Content Provider	IEEE Xplore Digital Library
Author	Balaban, Harold S. Haspert, Kent
Copyright Year	1963
Abstract	Relatively simple approaches to estimating Weibull parameters for a general class of devices are developed through regression models. It is assumed that data are collected on a number of device types belonging to a general class. For each device type, the only information available is the number of devices being observed, the total time observed and the total number of failures. By assuming a constant shape parameter and a scale parameter that may vary with the characteristics of the device-type, the least squares method is used to provide estimates of the parameters of a two-parameter Weibull distribution for both replacement and nonreplacement data. An approach is also suggested for dealing with troublesome cases of zero failure occurrences. A numerical example is provided to illustrate the approach.
Sponsorship	IEEE Reliability Society
Starting Page	111
Ending Page	117
Page Count	7
File Size	1280190
File Format	PDF
ISSN	00189529
Volume Number	R-21
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1972-05-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Parameter estimation Shape Sampling methods Testing Inspection Probability distribution Least squares approximation Sockets Large-scale systems Least squares methods
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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