NDLI: Analysis of Arbitrary Frequency-Dependent Losses Associated With Conducting Structures in a Time-Domain Electric Field Integral Equation

Content Provider	IEEE Xplore Digital Library
Author	Zicong Mei Yu Zhang Sarkar, T.K. Salazar-Palma, M. Baek Ho Jung
Copyright Year	2002
Abstract	The objective of this letter is to present a solution methodology for the analysis of arbitrary frequency-dependent losses on conducting structures in a time-domain electric field integral equation. The analysis of arbitrary frequency-dependent losses is incorporated in the newly developed marching-on-in-degree (MOD) method to solve the time-domain electric field integral equation. The novelty of this methodology is that both the arbitrary temporal dependence of the frequency-dependent losses and the transient current variations on the conducting structures are expanded in terms of the causal orthonormal associated Laguerre functions. The advantage of implementing these temporal expansion functions is that the convolution between two functional variations, namely the loss factor and the current density, can be treated in an analytical fashion resulting in an accurate and efficient solution methodology. Numerical examples dealing with both time-varying concentrated loads and skin-effect losses on electrically large conducting structures are analyzed to illustrate the potential of this method.
Sponsorship	IEEE Antennas and Propagation Society
Starting Page	678
Ending Page	681
Page Count	4
File Size	353329
File Format	PDF
ISSN	15361225
Volume Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Time domain analysis Polynomials Surface impedance Convolution Impedance Integral equations Skin effect time-domain electric field integral equation (TD-EFIE) Frequency-dependent loads Laguerre polynomials method of moments (MoM) skin-effect loss
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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