NDLI: Observations on electrotransport in thin aluminum films using resistance measurements

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Observations on electrotransport in thin aluminum films using resistance measurements

Content Provider	NASA Technical Reports Server (NTRS)
Author	Hummel, R. E. Breitling, H. M.
Organization	The National Aeronautics and Space Administration (NASA)
Copyright Year	1971
Abstract	Resistance measurements of five different portions of uncoated and partially SiO-overcoated aluminum stripes are reported. In specimens of both types the resistance increases at the cathode when the stripe is subjected to high current densities. In partially coated specimens the resistance decreases at the anode whereas it remains constant in the uncoated sample. The difference in behavior at the anode between coated and uncoated specimens is interpreted as being due to differences of ion accumulation: In the uncoated films hillocks are formed whereas in the specimen with partial overcoat the ions accumulate more evenly. Scanning-electron micrographs are shown to support this interpretation.
File Size	601471
File Format	PDF
Alternate Webpage(s)	http://www.archive.org/details/nasa_techdoc_19960015663
Archival Resource Key	ark:/13960/t0001129t
Language	English
Publisher Date	1971-01-01
Publisher Institution	NASA (non Center Specific)
Access Restriction	Open
Subject Keyword	Plasmasphere Hydrogen Ions Shock Wave Propagation Atmospheric Models Diffusivity Kinetic Energy Magnetic Fields Boltzmann Distribution Electric Potential Electron Density (concentration) Photoelectrons Hydrodynamics Neutral Atmospheres Shock Heating Magnetic Flux Shock Tubes Geomagnetism Refilling Two Fluid Models Shock Waves Oxygen Ions Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text

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