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Compendium of single event effects, total ionizing dose, and displacement damage for candidate spacecraft electronics for nasa (Document No: 20140017802)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Wilcox, Edward P. Boutte, Alvin J. Topper, Alyson D. Casey, Megan C. Cochran, Donna J. Ladbury, Raymond L. Pellish, Jonathan A. O'Bryan, Martha V. Campola, Michael J. Gigliuto, Robert A. Lauenstein, Jean-Marie Buchner, Stephen P. Berg, Melanie D. Violette, Daniel P. LaBel, Kenneth A. Chen, Dakai |
| Copyright Year | 2014 |
| Description | We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects (SEE), proton-induced displacement damage (DD), and total ionizing dose (TID). Introduction: This paper is a summary of test results.NASA spacecraft are subjected to a harsh space environment that includes exposure to various types of ionizing radiation. The performance of electronic devices in a space radiation environment is often limited by its susceptibility to single event effects (SEE), total ionizing dose (TID), and displacement damage (DD). Ground-based testing is used to evaluate candidate spacecraft electronics to determine risk to spaceflight applications. Interpreting the results of radiation testing of complex devices is quite difficult. Given the rapidly changing nature of technology, radiation test data are most often application-specific and adequate understanding of the test conditions is critical. Studies discussed herein were undertaken to establish the application-specific sensitivities of candidate spacecraft and emerging electronic devices to single-event upset (SEU), single-event latchup (SEL), single-event gate rupture (SEGR), single-event burnout (SEB), single-event transient (SET), TID, enhanced low dose rate sensitivity (ELDRS), and DD effects. |
| File Size | 254706 |
| Page Count | 1 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20140017802 |
| Archival Resource Key | ark:/13960/t9576dz4z |
| Language | English |
| Publisher Date | 2014-07-14 |
| Access Restriction | Open |
| Subject Keyword | Single Event Effects Displacement Damage Total Ionizing Dose Protons Nasa Programs Radiation Effects Heavy Ions Sensitivity Analysis Aerospace Environments Bit Error Rate Single Event Upsets Research Facilities Spacecraft Electronic Equipment Radiation Dosage Displacement Electronic Equipment Tests Ground Tests Ionizing Radiation Linear Energy Transfer Let Risk Assessment Flux Rate Radiation Damage Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Presentation |
