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Uncertainty analysis of seebeck coefficient and electrical resistivity characterization
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Dynys, Fred Sehirlioglu, Alp Mackey, Jon |
| Copyright Year | 2014 |
| Description | In order to provide a complete description of a materials thermoelectric power factor, in addition to the measured nominal value, an uncertainty interval is required. The uncertainty may contain sources of measurement error including systematic bias error and precision error of a statistical nature. The work focuses specifically on the popular ZEM-3 (Ulvac Technologies) measurement system, but the methods apply to any measurement system. The analysis accounts for sources of systematic error including sample preparation tolerance, measurement probe placement, thermocouple cold-finger effect, and measurement parameters; in addition to including uncertainty of a statistical nature. Complete uncertainty analysis of a measurement system allows for more reliable comparison of measurement data between laboratories. |
| File Size | 2400626 |
| Page Count | 1 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20140012564 |
| Archival Resource Key | ark:/13960/t6sz19987 |
| Language | English |
| Publisher Date | 2014-01-22 |
| Access Restriction | Open |
| Subject Keyword | Seebeck Effect Electrical Resistivity Thermoelectric Materials Root-mean-square Errors Bias Truncation Errors Thermoelectricity Characterization Systematic Errors Precision Germanium Mathematical Models Silicon Figure of Merit Room Temperature Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Presentation |
