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Genesis solar wind collector cleaning assessment: 60366 sample case study
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Burnett, D. S. Kuhlman, K. R. Gonzalez, C. P. Allton, J. H. Jurewicz, A. J. Goreva, Y. S. Burkett, P. J. Woolum, D. Rodriguez, M. C. |
| Copyright Year | 2014 |
| Description | In order to recognize, localize, characterize and remove particle and thin film surface contamination, a small subset of Genesis mission collector fragments are being subjected to extensive study via various techniques [1-5]. Here we present preliminary results for sample 60336, a Czochralski silicon (Si-CZ) based wafer from the bulk array (B/C). |
| File Size | 413306 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20140006567 |
| Archival Resource Key | ark:/13960/t0kt1pr39 |
| Language | English |
| Publisher Date | 2014-03-17 |
| Access Restriction | Open |
| Subject Keyword | Cleaning Decontamination Solar Wind Wafers Contamination Genesis Mission Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |