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Evaluation of commercial automotive-grade bme capacitors (Document No: 20140005416)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Liu, Donhang |
| Copyright Year | 2014 |
| Description | Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life |
| File Size | 425805 |
| Page Count | 14 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20140005416 |
| Archival Resource Key | ark:/13960/t6547q98m |
| Language | English |
| Publisher Date | 2014-04-01 |
| Access Restriction | Open |
| Subject Keyword | Capacitor Modeling Reliability Grain Boundaries Accelerated Life Tests Capacitors Capacitance Barium Titanates Ceramics Automobiles Mtbf Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
