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Probe station and near-field scanner for testing antennas
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Zaman, Afroz Barr, Philip J. Lee, Richard Q. Lambert, Kevin Miranda, Felix A. Darby, William G. |
| Copyright Year | 2006 |
| Description | A facility that includes a probe station and a scanning open-ended waveguide probe for measuring near electromagnetic fields has been added to Glenn Research Center's suite of antenna-testing facilities, at a small fraction of the cost of the other facilities. This facility is designed specifically for nondestructive characterization of the radiation patterns of miniaturized microwave antennas fabricated on semiconductor and dielectric wafer substrates, including active antennas that are difficult to test in traditional antenna-testing ranges because of fragility, smallness, or severity of DC-bias or test-fixture requirements. By virtue of the simple fact that a greater fraction of radiated power can be captured in a near-field measurement than in a conventional far-field measurement, this near-field facility is convenient for testing miniaturized antennas with low gains. |
| File Size | 479068 |
| Page Count | 1 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20110013603 |
| Archival Resource Key | ark:/13960/t4gn35p6v |
| Language | English |
| Publisher Date | 2006-10-01 |
| Access Restriction | Open |
| Subject Keyword | Microwave Antennas Test Facilities Antenna Design Near Fields Dielectrics Miniaturization Antenna Radiation Patterns Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
