NDLI: Processing waveform-based nde

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Processing waveform-based nde

Content Provider	NASA Technical Reports Server (NTRS)
Copyright Year	2011
Description	A computer implemented process for simultaneously measuring the velocity of terahertz electromagnetic radiation in a dielectric material sample without prior knowledge of the thickness of the sample and for measuring the thickness of a material sample using terahertz electromagnetic radiation in a material sample without prior knowledge of the velocity of the terahertz electromagnetic radiation in the sample is disclosed and claimed. Utilizing interactive software the process evaluates, in a plurality of locations, the sample for microstructural variations and for thickness variations and maps the microstructural and thickness variations by location. A thin sheet of dielectric material may be used on top of the sample to create a dielectric mismatch. The approximate focal point of the radiation source (transceiver) is initially determined for good measurements.
File Size	4621473
Page Count	58
File Format	PDF
Alternate Webpage(s)	http://archive.org/details/NASA_NTRS_Archive_20110011001
Archival Resource Key	ark:/13960/t01z9654t
Language	English
Publisher Date	2011-04-26
Access Restriction	Open
Subject Keyword	Foams Patents Nondestructive Tests Position Location Thermal Protection Fault Detection Waveforms Electromagnetic Radiation Dielectrics Microstructure Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text
Resource Type	Patent

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