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A wide range temperature sensor using soi technology
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Hammoud, Ahmad Patterson, Richard L. Elbuluk, Malik E. |
| Copyright Year | 2009 |
| Description | Silicon-on-insulator (SOI) technology is becoming widely used in integrated circuit chips for its advantages over the conventional silicon counterpart. The decrease in leakage current combined with lower power consumption allows electronics to operate in a broader temperature range. This paper describes the performance of an SOIbased temperature sensor under extreme temperatures and thermal cycling. The sensor comprised of a temperature-to-frequency relaxation oscillator circuit utilizing an SOI precision timer chip. The circuit was evaluated under extreme temperature exposure and thermal cycling between -190 C and +210 C. The results indicate that the sensor performed well over the entire test temperature range and it was able to re-start at extreme temperatures. |
| File Size | 1540142 |
| Page Count | 5 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20090042373 |
| Archival Resource Key | ark:/13960/t2d849j9k |
| Language | English |
| Publisher Date | 2009-05-24 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Test Ranges Leakage Temperature Sensors Integrated Circuits Soi Semiconductors Energy Consumption Thermal Cycling Tests Exposure Timing Devices Oscillators Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
