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Failure analysis of electrical pin connectors
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Smith, Stephen W. Newman, John A. Baughman, James M. Herath, Jeffrey A. |
| Copyright Year | 2008 |
| Description | A study was initiated to determine the root cause of failure for circuit board electrical connection pins that failed during vibRatory testing. The circuit board is part of an unmanned space probe, and the vibratory testing was performed to ensure component survival of launch loading conditions. The results of this study show that the pins failed as a result of fatigue loading. |
| File Size | 5615620 |
| Page Count | 13 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20080043565 |
| Archival Resource Key | ark:/13960/t28965v5w |
| Language | English |
| Publisher Date | 2008-10-01 |
| Access Restriction | Open |
| Subject Keyword | Metals And Metallic Materials Vibration Space Probes Failure Analysis Fatigue Materials Electric Connectors Circuit Boards Launching Pins Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |