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Back-illuminated ccd imager adapted for contrast transfer function measurements thereon
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1987 |
| Description | Stripe patterns of varying spatial frequency, formed in the top-metalization of a back-illuminated solid-state imager, facilitate on-line measurement of contrast transfer function during wafer-probe testing. The imager may be packaged to allow front-illumination during in-the-field testing after its manufacture. |
| File Size | 617828 |
| Page Count | 7 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20080008220 |
| Archival Resource Key | ark:/13960/t4nk87v56 |
| Language | English |
| Publisher Date | 1987-02-10 |
| Access Restriction | Open |
| Subject Keyword | Optics Charge Coupled Devices Patents Solid State Transfer Functions Metallizing On-line Systems Frequencies Illuminating Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Patent |
