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Virtex-ii pro see test methods and results
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Powell, Wesley Petrick, David Howard Jr., James W. LaBel, Kenneth A. |
| Copyright Year | 2004 |
| Description | The objective of this coarse Single Event Effect (SEE) test is to determine the suitability of the commercial Virtex-II Pro family for use in spaceflight applications. To this end, this test is primarily intended to determine any Singe Event Latchup (SEL) susceptibilities for these devices. Secondly, this test is intended to measure the level of Single Event Upset (SEU) susceptibilities and in a general sense where they occur. The coarse SEE test was performed on a commercial XC2VP7 device, a relatively small single processor version of the Virtex-II Pro. As the XC2VP7 shares the same functional block design and fabrication process with the larger Virtex-II Pro devices, the results of this test should also be applicable to the larger devices. The XC2VP7 device was tested on a commercial Virtex-II Pro development board. The testing was performed at the Cyclotron laboratories at Texas A&M and Michigan State Universities using ions of varying energy levels and fluences. |
| File Size | 14259533 |
| Page Count | 8 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20050139721 |
| Archival Resource Key | ark:/13960/t53f9qh7s |
| Language | English |
| Publisher Date | 2004-10-07 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Radiation Effects Bit Error Rate Space Environment Simulation Spacecraft Electronic Equipment Memory Computers Latch-up Electronic Equipment Tests Field-programmable Gate Arrays Commercial Off-the-shelf Products Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |