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Quartz crystal microbalance operation and in situ calibration
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Albyn, K. C. |
| Copyright Year | 2004 |
| Description | Quartz crystal microbalances (QCMs) are commonly used to measure the rate of deposition of molecular species on a surface. The measurement is often used to select materials with a low outgassing rate for applications where the material has a line of sight to a contamination-sensitive surface. A quantitative, in situ calibration of the balance, or balances, using a pure material for which the enthalpy of sublimation is known, is described in this Technical Memorandum. Supporting calculations for surface dwell times of deposited materials and the effusion cell Clausing factor are presented along with examples of multiple QCM measurements of outgassing from a common source. |
| File Size | 1238170 |
| Page Count | 26 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20050082212 |
| Archival Resource Key | ark:/13960/t08w8cj3f |
| Language | English |
| Publisher Date | 2004-11-01 |
| Access Restriction | Open |
| Subject Keyword | Solid-state Physics Beat Frequencies Outgassing Calibrating Enthalpy Sublimation Microbalances Dwell Quartz Crystals Effusives Deposition Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
