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Cots ceramic chip capacitors: an evaluation of the parts and assurance methodologies (Document No: 20040082164)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Sampson, Michael J. |
| Copyright Year | 2004 |
| Description | This viewgraph presentation profiles an experiment to evaluate the suitability of commercial off-the-shelf (COTS) ceramic chip capacitors for NASA spaceflight applications. The experiment included: 1) Voltage Conditioning ('Burn-In'); 2) Highly Accelerated Life Test (HALT); 3) Destructive Physical Analysis (DPA); 4) Ultimate Voltage Breakdown Strength. The presentation includes results for each of the capacitors used in the experiment. |
| File Size | 24974993 |
| Page Count | 31 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20040082164 |
| Archival Resource Key | ark:/13960/t5v74d53h |
| Language | English |
| Publisher Date | 2004-01-08 |
| Access Restriction | Open |
| Subject Keyword | Accelerated Life Tests Capacitors Burn-in Ceramics Electrical Faults Destructive Tests Commercial Off-the-shelf Products Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |