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Microstructural and defect characterization in ceramic composites using an ultrasonic guided wave scan system
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Roth, D. J. Cosgriff, L. M. Bhatt, R. T. Verrilli, M. J. Martin, R. E. |
| Copyright Year | 2003 |
| Description | In this study, an ultrasonic guided wave scan system was used to characterize various microstructural and flaw conditions in two types of ceramic matrix composites, SiC/SiC and C/SiC. Rather than attempting to isolate specific lamb wave modes to use for characterization (as is desired for many types of guided wave inspection problems), the guided wave scan system utilizes the total (multi-mode) ultrasonic response in its inspection analysis. Several time and frequency-domain parameters are calculated from the ultrasonic guided wave signal at each scan location to form images. Microstructural and defect conditions examined include delamination, density variation, cracking, and pre/ post-infiltration. Results are compared with thermographic imaging methods. Although the guided wave technique is commonly used so scanning can be eliminated, applying the technique in the scanning mode allows a more precise characterization of defect conditions. |
| File Size | 1057264 |
| Page Count | 14 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20030093551 |
| Archival Resource Key | ark:/13960/t7fr4tz67 |
| Language | English |
| Publisher Date | 2003-09-01 |
| Access Restriction | Open |
| Subject Keyword | Nondestructive Tests Ceramic Matrix Composites Time Domain Analysis Silicon Carbides Ultrasonic Scanners Microstructure Frequency Domain Analysis Defects Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |