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Overview of device see susceptibility from heavy ions
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Nichols, D. K. Coss, J. R. McCarthy, K. P. Schwartz, H. R. Smith, L. S. |
| Copyright Year | 1998 |
| Description | A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated. |
| File Size | 1006228 |
| Page Count | 16 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20010066480 |
| Archival Resource Key | ark:/13960/t6c29tv60 |
| Language | English |
| Publisher Date | 1998-01-15 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Errors Trends Heavy Ions Latch-up Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
