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Heat flux measurements on ceramics with thin film thermocouples
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Anderson, Robert C. Liebert, Curt H. Holanda, Raymond |
| Copyright Year | 1993 |
| Description | Two methods were devised to measure heat flux through a thick ceramic using thin film thermocouples. The thermocouples were deposited on the front and back face of a flat ceramic substrate. The heat flux was applied to the front surface of the ceramic using an arc lamp Heat Flux Calibration Facility. Silicon nitride and mullite ceramics were used; two thicknesses of each material was tested, with ceramic temperatures to 1500 C. Heat flux ranged from 0.05-2.5 MW/m2(sup 2). One method for heat flux determination used an approximation technique to calculate instantaneous values of heat flux vs time; the other method used an extrapolation technique to determine the steady state heat flux from a record of transient data. Neither method measures heat flux in real time but the techniques may easily be adapted for quasi-real time measurement. In cases where a significant portion of the transient heat flux data is available, the calculated transient heat flux is seen to approach the extrapolated steady state heat flux value as expected. |
| File Size | 8374026 |
| Page Count | 16 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19940006838 |
| Archival Resource Key | ark:/13960/t03z35z3k |
| Language | English |
| Publisher Date | 1993-11-01 |
| Access Restriction | Open |
| Subject Keyword | Thin Films Temperature Measurement Mullites Thermocouples Silicon Nitrides Ceramics Heat Measurement Heat Flux Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |