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Reliability in cmos ic processing
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Ferrier, S. Hall, D. Wang, J. Shreeve, R. |
| Copyright Year | 1990 |
| Description | Critical CMOS IC processing reliability monitors are defined in this paper. These monitors are divided into three categories: process qualifications, ongoing production workcell monitors, and ongoing reliability monitors. The key measures in each of these categories are identified and prioritized based on their importance. |
| File Size | 810282 |
| Page Count | 14 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19940004344 |
| Archival Resource Key | ark:/13960/t6b32s166 |
| Language | English |
| Publisher Date | 1990-11-06 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Integrated Circuits Component Reliability Performance Tests Electronic Packaging Quality Control Circuit Reliability Design Analysis Cmos Qualifications Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
